Measurements of fractal dimensionality in 0.1Cs2O–0.9TeO2 glass-forming tellurite system by Raman spectroscopy

Abstract Low-frequency Raman spectroscopy was utilized in order to estimate the fractal dimensionality for tellurite 0.1Cs 2 O–0.9TeO 2 binary glass-forming system in a temperature range, which includes the glassy and supercooled liquid state. A variation in fractal dimensionality was observed and calculated directly from the Raman spectroscopic data. This variation can be interpreted as an indication of structural alterations caused by temperature variation and correlated with existing structural models concerning tellurite network. Low-frequency Raman spectroscopy has proved to be a valuable tool for studying the fractal dimensionality and structural transformation in amorphous phases. The estimation of the localization degree of lattice vibration in disordered materials is important and discussed in the context of current phenomenological status of the field.