Elemental analysis of zeolites by PIXGE

Abstract The proton-induced X- and gamma-ray emission (PIXGE) method is applied for the elemental analysis of thick zeolite samples. In the case of synthesized ZSM-5 samples bombarded by protons of 4 MeV energy in vacuo during 10 min, the accuracy of simultaneous elemental determination is typically 0.5% for silicon, 3% for sodium and aluminium and 5–10% for up to 15 trace elements. The PIXGE method employing thick targets is fast and sensitive and it requires a minimum effort in calibration and target preparation. However, it is subject to target heating and bremmstrahlung effects. The optimal determination of particular elements such as boron or barium is illustrated. Limited reproductiveness is encountered in beam current integration.