Novel Sample-handling Approach for XRD Analysis with Minimal Sample Preparation
2004
Introduction: Sample preparation and sample handling are among the most critical operations associated with X-ray diffraction (XRD) analysis. These operations require attention in a laboratory environment, but they become a major constraint in the deployment of XRD instruments for robotic planetary exploration. We are developing a novel sample handling system that dramatically relaxes the constraints on sample preparation by allowing characterization of coarsegrained material that would normally be impossible to analyze with conventional powder-XRD techniques.
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