Dielectric characteristics and positron annihilation study of Eu2O3-doped CaCu3Ti4O12 ceramics

Abstract Eu 2 O 3 -doped CaCu 3 Ti 4 O 12 ceramics were sintered using traditional solid-state reaction method. The microstructure and dielectric characteristics of samples were measured and their interrelation was analyzed. The results indicate that a small quantity of Eu 2 O 3 -doped in CCTO can deter the formation of Cu-enriched phase and improve the structure of crystal grains, which is of help to improve the thermal and frequency stability of dielectric properties. Positron annihilation lifetime spectra measurements indicate that a small quantity of Eu 2 O 3 doping in CCTO can reduce the defect concentration and thin grain boundary layers in the material. The dielectric characteristics of CCTO have been explained in terms of the defects in the material. It is concluded that the microstructure and the dielectric properties of CCTO can greatly be improved by doping with 0.2 wt% of Eu 2 O 3 . The ramifications of current study could be very useful in applications of this important material.