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X-ray Induced force changes on a Ge surface in XANAM measurements
X-ray Induced force changes on a Ge surface in XANAM measurements
2018
Shushi Suzuki
Shingo Mukai
Wang-Jae Chun
Masaharu Nomura
Kiyotaka Asakura
Keywords:
Analytical chemistry
Semiconductor
X-ray
Materials science
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