THz to Inspect Graphene and Thin Film Materials

In this paper, we present a system that provides meso-scale characterization of thin film materials, covering the gap between nano-scale and macro-scale methods. Nano-scale methods are slow and cannot characterize large surfaces. Macroscale methods generate characterization that averages the magnitudes and, thus, cannot provide localized information. Our system works in reflection as opposed to state-of-the-art methods and provides mobility, carrier density, and conductance maps in the THz range. Moreover, it can be integrated with reactors and enables monitoring of the fabrication of materials in real-time, supporting, for instance, the production of graphene at industrial scale.