Electron beam-induced absorption modulation imaging of strained In0.2Ga0.8As/GaAs multiple quantum wells

We have examined the effects of electron‐hole plasma generation on excitonic absorption phenomena in nipi‐doped In0.2Ga0.8As/GaAs multiple quantum wells (MQWs) using a novel technique called electron beam‐induced absorption modulation imaging. The electron‐hole plasma is generated by a high‐energy electron beam in a scanning electron microscope and is used as a probe to study the MQW absorption modulation. The influence of structural defects on the diffusive transport of carriers is imaged with a μm‐scale resolution.