Old Web
English
Sign In
Acemap
>
Paper
>
Recombination Current and Carrier Lifetime Extraction in Dual-Gate Fully Depleted SOI Devices
Recombination Current and Carrier Lifetime Extraction in Dual-Gate Fully Depleted SOI Devices
1998
Ernst
Cristoloveanu
Vandooren
Colinge
Flandre
Keywords:
Optoelectronics
Carrier lifetime
Spontaneous emission
Microelectronics
Voltage
Extraction (chemistry)
Electric potential
Silicon on insulator
Doping
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]