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Corrosion resistance of organic layers on GaAs via x-ray reflectometry characterization
Corrosion resistance of organic layers on GaAs via x-ray reflectometry characterization
2004
Justin Douglas Smith
Trevor R. Finlayson
C. Kirchner
Uwe Klemradt
Keywords:
Analytical chemistry
Corrosion
X-ray
Materials science
Reflectometry
Correction
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