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In situ Grazing Incidence Small Angle X-Ray Scattering Study of Permalloy Thin Film Growth on Nanorippled Si
In situ Grazing Incidence Small Angle X-Ray Scattering Study of Permalloy Thin Film Growth on Nanorippled Si
2017
Sarathlal Koyiloth Vayalil
Stephan V. Roth
Gonzalo Santoro
Peng Zhang
Matthias Schwartzkopf
Bjoern Beyersdorff
Keywords:
Thin film
Small-angle X-ray scattering
Permalloy
Materials science
Optics
In situ
Correction
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