Effect of small changes in composition on the electrical and structural properties of YBa2Cu3O7 thin films

Epitaxial thin films of YBa2Cu3O7 have been grown in situ by evaporation onto (001) MgO substrates. The composition was varied systematically to investigate the effects of changes in Cu content and Ba/Y ratio on the film properties. The results demonstrate that deviations from stoichiometry at the limit of resolution of most analytic techniques can have a large effect on structural and transport properties, as well as causing marked changes in surface morphology. The best properties (Jc≳3×106 A/cm2 at 77 K) are only found for a narrow range of compositions, which can be readily identified from the surface morphology.