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Development of transparent windows for a new generation of Cherenkov counters sensitive in the EUV range
Development of transparent windows for a new generation of Cherenkov counters sensitive in the EUV range
1994
A. Braem
D Hatzifotiadou
E. Rosso
D. Fraissard
G. Charpak
G. Lecoeur
Ioanis Giomataris
D G Drakoulakos
Keywords:
Cherenkov radiation
Optics
Extreme ultraviolet lithography
Optoelectronics
Physics
Correction
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