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Optical and electrical characterization of deep traps in erbium doped silicon
Optical and electrical characterization of deep traps in erbium doped silicon
2017
A. Castaldini
A. Cavallini
Beatrice Fraboni
S. Binetti
M. Donghi
S. Pizzini
G. Wagner
Keywords:
Analytical chemistry
Doping
Silicon
Erbium
Materials science
Optoelectronics
Correction
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