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Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands
Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands
2008
C. Mocuta
J. Stangl
K. Mundboth
T. H. Metzger
G. Bauer
I. Vartanyants
M. Schmidbauer
T. Boeck
Keywords:
Scanning electron microscope
X-ray crystallography
Nuclear magnetic resonance
X-ray
Ensemble average
Physics
Condensed matter physics
Correction
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