Old Web
English
Sign In
Acemap
>
Paper
>
Nanoindentation Based Fatigue Analysis of Semiconductor Bridge (SCB) for Mechanical Reliability
Nanoindentation Based Fatigue Analysis of Semiconductor Bridge (SCB) for Mechanical Reliability
2015
Pradnya M. Bodhankar
Chetan Gurada
Shrihari Shinde
H. Muthurajan
Virendra Kumar
Jmsse
Keywords:
Nanoindentation
Semiconductor
Composite material
Materials science
mechanical reliability
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
1
Citations
NaN
KQI
[]