Optically trapped probes with nanometer-scale tips for femto-Newton force measurement
2010
We describe the development of a novel force probe, controlled by multiple optical traps, with a nanometer-scale tip that protrudes outside the direct laser radiation field. We have measured forces to an accuracy of 240?fN, which enables future experiments that probe photo-sensitive components (such as biological cells) and non-transparent objects. The probes were produced using two methods, electron beam lithography and two-photon polymerization, with the latter providing approximately twice as much trapping stiffness.
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