The influence of emotional intelligence and perfectionism on Error-Related Negativity: An event related potential study

Abstract In the present study, we examined group differences in Error-Related Negativity (ERN) based on perfectionism and emotional intelligence (EIQ). ERN is an ERP component that is generated in the anterior cingulate cortex and peaks 60–150 ms after making an error response on a task. The amplitude of the ERN after making a mistake reflects individual differences in emotional traits and performance concerns. Past researchers have found that participants higher in perfectionistic doubts displayed larger ERN amplitudes; however, researchers have not yet differentiated between type of perfectionism (i.e., adaptive or maladaptive) in relation to ERN. Additionally, previous researchers have found affective processes are reflected in ERN, but have not yet examined whether differences in ERN could be influenced by EIQ. Participants in the present study were 34 adults who responded to surveys and completed a computerized ERN paradigm utilizing a flanker task while neural activity was recorded using EEG. The paradigm was designed to elicit a high error rate, thereby allowing capture and measurement of the ERN component. ANOVA results indicated maladaptive perfectionists had the greatest negativity, followed by adaptive perfectionists, followed by nonperfectionists. ANOVA results indicated individuals with high EIQ had lower ERN than individuals with low EIQ.