Characterization of frequency dispersion in Ti‐indiffused lithium niobate optical devices

1987 
The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate substrate orientations is characterized. Dispersion in the dielectric constants and the electro‐optic coefficients causes most device configurations to have a significantly different electro‐optic response at frequencies above and below the acoustic resonances. Only the configuration that uses the r33 electro‐optic coefficient displays a broadband, well behaved frequency response.
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