Optimized MBT-Test Case Generation for Embedded System Controller Using LabVIEW and Sequence Graphs

System testing using model-based approach is gaining momentous acceptance worldwide not only in academics but also in industrial context. Rapid technological advancements in the software industries drive the software engineers to produce highly expedited applications in minimum time without spending more efforts on testing and maintenance activities. The design artifacts are modeled using LabVIEW software and validated to produce optimized test paths. A rising inclination is observed in the Model-Based Testing (MBT) of software systems embedded on various devices. This article primarily focusses upon the model-based testing of embedded application of elevator controller using state machines and transforming these to graphical notations to generate test paths. An algorithm is designed to traverse all nodes and provide full coverage of system. A taxonomy of test case generation is described, which can serve as a fundamental basis to develop strategies to derive potential testing techniques.