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Electrically Isolated SiGe Quantum Dots Demostrated by Electric Force Microscopy
Electrically Isolated SiGe Quantum Dots Demostrated by Electric Force Microscopy
2002
Emma Tevaarwerk
Olivia M. Castellini
D. G. Keppel
M. A. Eriksson
Paul P. Rugheimer
Max G. Lagally
Keywords:
Atomic force acoustic microscopy
Non-contact atomic force microscopy
Conductive atomic force microscopy
Microscopy
Photoconductive atomic force microscopy
Quantum dot
Analytical chemistry
Transmission electron microscopy
Physics
Scanning gate microscopy
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