A compact and versatile grating spectrograph for soft X-ray emission analysis

A flexible spectrograph for the investigation of soft X-ray spectra in the range between 1 nm and 20 nm is presented. Based on two variable-line spaced reflection gratings, the design enables stand-alone operation, the change between the use of an entrance slit and a slitless operation mode as well as a maximum compactness and robustness due to a reduced number of motorized stages. Characterization measurements as well as first proof-of-principle X-ray emission investigations show the potential of the instrument for versatile applications.A flexible spectrograph for the investigation of soft X-ray spectra in the range between 1 nm and 20 nm is presented. Based on two variable-line spaced reflection gratings, the design enables stand-alone operation, the change between the use of an entrance slit and a slitless operation mode as well as a maximum compactness and robustness due to a reduced number of motorized stages. Characterization measurements as well as first proof-of-principle X-ray emission investigations show the potential of the instrument for versatile applications.