Method and device for detecting functional performance of integrated chip based on model identification

The invention relates to a method for detecting the functional performance of an integrated chip based on model identification. The method comprises the following steps of 1, reading an IBIS (Input/Output Buffer Information Specification) model file through a main control platform, analyzing the model of the chip and the I/O characteristic curve of a first input pin through a model resolving unit, translating the characteristic curve into a parameter value which can be tested, transmitting to a parameter receiving/transmitting unit through a command, sending the command to a signal simulating and detecting device, making a microprocessor of the signal simulating and detecting device generate a simulation voltage or a logical level according to a control signal source, and transmitting to the input pin of a chip to be detected via a pin driving and protecting circuit of the chip to be detected; and 2, starting a high-speed ADC (Analog-Digital Converter), reading and recording the parameter value of the output pin end of the chip to be detected in real time, starting the parameter receiving/transmitting unit for receiving current group output information, and saving. According to the method and the device, an IBIS model is taken as the testing basis of the integrated chip, so that a special SCPI (Standard Command for Programming Instrument) file is not required to be acquired. The functional and performance testing of any chip can be realized.