AFM phase imaging study of heat treatment effect on phase composition of LI-Mn-O system electrode material

Discussion and results To study modified CMD samples heat treated at 400 and 450 C, AFM measurements of surface topography and phase imaging were performed. Phase image is produced by monitoring the phase difference between the oscillations of the cantilever and the standard signal, recorded by the piezoelectric element. This difference is related closely to the properties of surface and in many cases can give better resolution together with some information about material properties [4]. Figure 1 shows the topographic and phase images (collected using the tapping mode) of heat treated at 400 (Fig. 1, a) and 450 C (Fig. 1, b), respectively. It can be clearly seen the beginning of growth of new phase resembling nut shells at 400 C (Fig. 1, a (right)) and small grains of the same phase at elevated temperature (Fig. 1, b (right)). The phase contrast of other surface regions may not be generated if the surface is highly uniform [4]. 3D-representation, coloured with phase data to highlight lateral correlation in Fig. 2 indicates that third phase component probably of amorphous nature is also formed at 450 C.