Non-destructive MEMS atomic vapor cells characterization by Raman spectroscopy and image analysis

The use of innovative and non-destructive methods to characterize the content of MEMS atomic vapor cells for atomic devices is reported: Raman spectroscopy is used as a fast and quantitative method to estimate the Nitrogen pressure inside the cell cavity and image analysis is used to quantify the amount of metallic Rubidium. These techniques can be used for buffer gas pressure optimization and cell lifetime assessment.