Hall Effect in Polycrystalline Organic Semiconductors: The Effect of Grain Boundaries

The authors are grateful to the following programs for the financial support of this work. V.P. and H.H.C. acknowledge support from the National Science Foundation under the grant ECCS-1806363 and the Rutgers Energy Institute (REI). K.C. and H.H.C. acknowledge support from the Center for Advanced Soft-Electronics at Pohang University of Science and Technology funded by the Republic of Korea's Ministry of Science, ICT and Future Planning as Global Frontier Project (CASE-2011-0031628). M.A.F. and B.P.R. acknowledge support from the National Science Foundation Award No. ECCS-1709222. A.F.P., J.P., M.H., and T.D.A. acknowledge financial support from the Engineering and Physical Sciences Research Council (EPSRC) (Grant No. EP/G037515/1) and from the European Research Council (ERC) AMPRO Project No. 280221. T.D.A. and A.F.P. acknowledge the support from King Abdullah University of Science and Technology (KAUST). O.S. acknowledge the support of the Center for Absorption in Science of the Ministry of Immigrant Absorption in Israel under the framework of the KAMEA Program.