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Scanning Force Microscopy and Its Application to Engineered Materials
Scanning Force Microscopy and Its Application to Engineered Materials
1993
L. McDonnell
M.E. Woods
M. Phelan
J. Nieuwenhuizen
A. Thissen
J. Alexandre
E. Hayes
E. M. Cashell
Keywords:
Scanning probe microscopy
Scanning confocal electron microscopy
Scanning ion-conductance microscopy
Dark field microscopy
Composite material
Materials science
Nanotechnology
Scanning capacitance microscopy
Intravital microscopy
Microscopy
Scanning Force Microscopy
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