Old Web
English
Sign In
Acemap
>
Paper
>
Influence of contamination layer on thickness evaluation by X-ray reflectometry
Influence of contamination layer on thickness evaluation by X-ray reflectometry
2019
Yasushi Azuma
Akira Kurokawa
Keywords:
Analytical chemistry
Reflectometry
Chemistry
Contamination
X-ray
Mineralogy
Correction
Source
Cite
Save
Machine Reading By IdeaReader
11
References
3
Citations
NaN
KQI
[]