Electronics test point optimization overview

The electronic products failure prediction is one of the key technologies of failure prediction and health manage-ment technology.Based on this,the paper reviews the test-point selection and optimization method of electronic products failure prediction and health management.Firstly,this paper reviews the status of technological development and related technologies,including the failure mode and criticality analysis technology in test point optimization process,the calcula-tion method of electronic equipment fault detection rate and failure rate,the general steps of test points optimization of electronic products,the key issues need to be solved in the test-point optimization process,selection of circuit fault di ag-nosis method and selection of the test-point optimization algorithm and optimization model of electronic products.Finally,it makes recommendations to carry out technology research on electronic products fault prediction and health management in China.