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Investigation of Drain Current RTS Noise in Small Area Silicon MOS Transistors
Investigation of Drain Current RTS Noise in Small Area Silicon MOS Transistors
1991
Roux
Dierickx
Simoen
Claeys
Ghibaudo
Brini
Keywords:
Materials science
Logic gate
Noise
Silicon
drain current
Transistor
Optoelectronics
Correction
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