Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate

Abstract Microphotoluminescence (μ-PL) measurements were carried out to investigate the optical properties of single Cd 0.6 Zn 0.4 Te/ZnTe quantum dots (QDs) grown on Si (001) substrate by using molecular beam epitaxy. The high quality of single Cd 0.6 Zn 0.4 Te/ZnTe QDs is witnessed by resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Polarization-dependent and power-dependent μ-PL spectroscopy measurements were performed to identify the exciton, the biexciton, and the charged exciton in the emission spectra of single QDs. Furthermore a weak linearly polarized line is observed on the low energy side of the neutral exciton and is ascribed to dark exciton recombination.