Mount-type test equipment and method thereof

The present invention implements that can simulate testing conditions of the various implementation environments improve the reliability of the quality of the memory device and by minimizing the loss (loss) due to changes in the implementation environment to reduce test time and money to enhance the competitiveness of products It provides the type test equipment and method. The mount test equipment captures a signal for the test logic from an external device (capture) the capture system; Pattern data center that stores the logic data from the capture system; And in accordance with the tester schedule download the specific pattern data from the pattern data center receives the tester main board to be temporarily stored and test (Device Under Test) DUT using a local storage device and the pattern data transmission for transmitting it to the test mainboard include; comprising a tester main frame.