Measurement of geometrical aberration by holographic gratings

A new method of geometrical aberration measurement for an optical system with large aperture is proposed by using a series of holographic gratings, which are linearly recorded with 0 and +/- 1 order diffractions or nonlinearly recorded with more order diffractions. According to the aberration property (symmetry or unsymmetry) of the optical system undertest, one or two dimension gratings can be used. Some experimental results are given and related problems are discussed.