Local Supply Voltage Adjustment for Low Power Parametric Yield Increase
2006
A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS.
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