Feedback-based intelligent scanning electronic transformer merging unit Testing Method

The present invention relates to intelligent scanning electron detection method based on cell characteristics Transformer combined feedback, the method to dynamically adjust the scanning strategy based on feedback information merging unit, the final analog electronic transducer multiplexed digital signals the body, break the merger between the body and the transformer unit communication "semi-private" technical barriers, the body can solve electronic transformer and merging unit can only be less than the overall test, eliminating the combined performance of the unit itself can not be independently verified and tested the buried risks, providing an important guarantee for the consolidation unit itself as well as the electronic transformer technology to improve overall. The combined unit multi-port scanning process based on feedback information automatically determine and adjust the policies, quickly and accurately without the need for human judgment, high intelligence tests.