Characterization of Polygonal Planar Loop Probe for Near-Field Measurement Application

Every electronic equipment can emit electromagnetic interference and interfere with other electronic components and equipment. To find out how much Electromagnetic Interference (EMI) is generated due to electronic device components, near field measurements are needed. The planar loop probe is a near field measurement tool. In this study, a polygonal planar loop was designed for near field applications. Various planar loop probes with a different number of sides are triangle, rectangular, hexagon, octagon, pentagon and circle. The polygonal probes were characterized and compared and then looking for the best sensitivity. The triangular polygonal planar probe has the best sensitivity. But in the S 11 characteristic, overall in some frequency, the cirde model is the best.