Low-temperature scanning field emission microscope with polarization analysis
2020
the design of the low-temperature scanning probe microscope, which works in field emission regime with spin polarization analysis, is proposed. A performance at temperature of 77 K has been achieved. The first result of STM imaging with atomic resolution is demonstrated.
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI