Economics of design and test for electronic circuits and systems

Evaluating cost, schedule and quality issues of a multi-chip through simulation DOM - a Defect Occurrence Model for evaluating the life cycle costs of text strategies concurrent information systems engineering and quality control with CFS hierarchical testability analysis and test generation using functional modelling - a solution to test design bottleneck aspects of design quality models economical test sets for bridging faults on printed circuit boards a concurrent design for test metric the use of scan paths in the debugging and testing of the Epsilon-2 research computer the economics of designing testability into an existing microprocessor board economics of ASIC test development EDIF test view - a proposed industry standard for test data interchange dynamic predictive testing based on regression analysis in manufacturing processes a strategy for an enhanced reliability improvement process economical test aspects associated with laser-programmable multichip module technology Cheops - cost driven heuristic for partial scan generation the application of analytical cost models for optimization of field service strategies test cost modelling techniques and use implementing and managing a 1149 program.