Analysis and measurement of temperature effect on electromagnetic susceptibility of embedded ADC

Analog to Digital Converter (ADC) is widely used in measurement and control systems, the electromagnetic susceptibility problem of embedded ADC has been gradually highlighted in complex environment. The ambient temperature effect on electromagnetic susceptibility is analyzed by theoretical analysis and experimental measurement. Combined with the structure and characteristic of ADC, the mechanism of radio frequency interference signal disturbing ADC is analyzed. The influence of temperature effect on drain current of metal-oxide-semiconductor(MOS) transistors under interference signal is pointed out. At different temperatures, the circuit parameters of each part are measured and analyzed under electromagnetic interference. The temperature effect on ADC electromagnetic susceptibility is measured within the frequency range from 10 MHz to 1 GHz and the temperature range from -10 ℃ to 80 ℃. Results show that the changing ambient temperature changes the response of ADC under electromagnetic interference by altering the mobility of MOS transistors, causing significant drift of electromagnetic susceptibility.