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Analysis of potential risks in nanotechnologies at workplaces using e-beam device UE-202
Analysis of potential risks in nanotechnologies at workplaces using e-beam device UE-202
2013
O V Demetska
T. Yu. Tkachenko
V.A. Movchan
I. M. Andrusyshyna
V I Vasilyev
Keywords:
Electrical engineering
Electron beam processing
Computer science
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