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Analysis of drain current transients and L.F. channel noise to detect deep levels in HEMTs
Analysis of drain current transients and L.F. channel noise to detect deep levels in HEMTs
1995
Nathalie Saysset
Nathalie Labat
Andre Touboul
Yves Danto
Keywords:
Physics
Communication channel
Electronic engineering
Optoelectronics
drain current
Correction
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