Old Web
English
Sign In
Acemap
>
Paper
>
nvestigation of Al-PMA Effect on Al2O3/GeOX/Ge Gate Stack
nvestigation of Al-PMA Effect on Al2O3/GeOX/Ge Gate Stack
2006
Y. Nagatomi
Y. Nagaoka
K. Yamamoto
D. Wang
H. Nakashima
Keywords:
gate stack
Materials science
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]