Extended function of a high‐Tc transition edge bolometer on a micromachined Si membrane

The bolometric performance of a high‐Tc transition edge bolometer has been evaluated within the temperature range 80 Kmidpoint and remains at moderate levels up to room temperature. The bolometric time constant of the device increases from 0.33 ms at transition midpoint to 1.55 ms at ambient temperature. The noise pattern displays 1/f  behavior at low frequency and is scaling with bias current and the thermal resistance coefficient β of the superconducting film.