Old Web
English
Sign In
Acemap
>
Paper
>
Error prediction based on concurrent self-test and reduced slack time
Error prediction based on concurrent self-test and reduced slack time
2011
Gherman
Massas
Evain
Chevobbe
Bonhomme
Keywords:
Flip-flop
Least slack time scheduling
self test
Transistor
Electronic engineering
Fault coverage
CMOS
cmos logic circuits
Computer science
Built-in self-test
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
1
Citations
NaN
KQI
[]