Application of 241Am EDXRF to the determination of rare earth samples of solvent extraction processes

Abstract A rapid energy dispersive X-ray fluorescence spectroscopy (EDXRF) analysis system is established to determine rare earth concentrations. The characteristic K-shell series X-rays of rare earths were excited by a 1.1×10 9  Bq 241 Am radioisotope source. The spectra were recorded and analyzed using a multi-channel analyzer, employing a high-purity Ge detector. In this method, the Compton scattering peak, absorption of elements, and specific simplification are considered. Samples of light, middle and heavy rare earths during separation processes in both hydrochloride solution and rare earth loaded organic phases were analyzed off-line. Some comparative results measured by ICP are also given. The results show that the method can be used for a wide range of rare earth concentrations (0.1–300 g l −1 rare earth oxide). Being rapid, effective, precise and non-destructive, the method can be applied to on-line analysis to determine rare earth concentrations during separation by solvent extraction.