Microstructural studies of In bumps in 100 x 100 mercury cadmium telluride PV arrays and Si-CCD by SEM

This paper describes the microstructural characterization of In bumps in 100X100 PV MCT arrays and Si-CCD by SEM. Initially In bumps were grown by lift-off technique & modified for desired characteristics by giving heat treatments. Proper shape with uniformity in height & dia alongwith lower grain size of In bumps were acheived for proper integration of 100 x 100 PV MCT arrays and Si CCDs.