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Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.
2022
Michiel Vandemaele
Ben Kaczer
Erik Bury
Adrian Chasin
Jacopo Franco
Alexander Makarov
Hans Mertens
Geert Hellings
Guido Groeseneken
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