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Modeling Hot-Electron Trapping in GaN-based HEMTs.
Modeling Hot-Electron Trapping in GaN-based HEMTs.
2022
Nicola Modolo
Carlo De Santi
Andrea Minetto
Luca Sayadi
Sebastien Sicre
Gerhard Prechtl
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
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