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Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.
2022
J.P. Bastos
Barry J. O’Sullivan
Jacopo Franco
Brecht Truijen
Adrian Chasin
Robin Degraeve
Ben Kaczer
Romain Ritzenthaler
E. Capogreco
E. Dentoni Litta
Alessio Spessot
Yusuke Higashi
Y. Yoon
V. Machkaoutsan
Pierre Fazan
Naoto Horiguchi
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