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Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors.
Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors.
2022
Yutaka Terao
Takuji Hosoi
Takuma Kobayashi
Takayoshi Shimura
Heiji Watanabe
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