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Simulation-Based Understanding of "Charge-Sharing Phenomenon" Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit.
Simulation-Based Understanding of "Charge-Sharing Phenomenon" Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit.
2022
Akifumi Maru
Akifumi Matsuda
Satoshi Kuboyama
Mamoru Yoshimoto
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